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EIA JESD 51-3:1996 Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
EIA JESD 54:1996 Standard for Description of 54/74ABTXXX and 74BCXXX TTL-Compatibility BiCMOS Logic Devices
EIA JESD 55:1996 Standard for Description of Low-Voltage TTL-Compatible BiCMOS Logic Devices
EIA JESD 57:1996 Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation
EIA-700AAAB:1996 Detail Specification for 1.0 mm, Two-Part Connectors for Use with Parallel Printed Boards
EIA/IS-692:1996 Ceramic Capacitor Qualification Specification
EIA-700A0AB:1995 Detail Specification for 1.27 mm Pitch, 68 Circuit Memory Card Interconnect System
EIA-520FAAB:1995 Detail Specification for Rotary Switches of Certified Quality (Low Current Rating) 16 Positions Maximum
EIA-520FAAA:1995 Detail Specification for Rotary Switches of Certified Quality (Low Current Rating) 12 Positions Maximum
EIA TSB 74:1995 Support for 14.4 kbps Data Rate and PCS Interaction for Wideband Spread Spectrum Cellular Systems
EIA/TIA-455-38:1995 FOTP-38 Measurement of Fiber Strain in Cables under Tensile Load
EIA JESD 35-1:1995 General Guidelines for Designing Test Structures for the Wafer-Level Testing of Thin Dielectrics