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The method described in this document applies to all reliability mechanisms associated with electronic components. The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic components.
Author | EIA |
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Editor | EIA |
Document type | Standard |
Format | File |
Confirmation date | 2011-01-01 |
ICS | 31.020 : Electronic components in general
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Number of pages | 20 |
Replace | EIA JESD 91 (2001-12) |
Year | 2003 |
Document history | EIA JESD 91A (2003-08) |
Country | USA |
Keyword | EIA 91A;91A;EIA JESD91A |