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This standard is to promote unification of content and format of semiconductor device failure-analysis reports so that reports from diverse laboratories may be easily read, compared, and understood by customers. Additional objectives are to ensure that reports can be easily ready by users, satisfactorily reproduced on copying machines, adequately transmitted by telefax, and conveniently stored in standard filing cabinets.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 03.120.01 : Quality in general
31.020 : Electronic components in general |
| Number of pages | 12 |
| Year | 1990 |
| Document history | |
| Country | USA |
| Keyword | EIA 38;38;EIA JESD38 |