EIA/TIA-455-13-A:1996 (R2012)

The appropriate application of this procedure is for examination of products for 'Macro-type' defects rather than for 'Micro-type' defects, which may also be present in any product. Consequently, relatively low power magnification values have been specified for optical instruments, and nonspecialized measurement instrument usage is intended. Do not apply this procedure to critical defects or product features that cannot be reliably detected and evaluated by the apparatus referenced in this test method. For those instances, utilize another test method that provides more suitable procedures or establish a new method specific to that requirement. However, as noted in 3.4 and 8.7, the Detail Specification may require additional or modified criteria and apparatus when deemed necessary by specific product requirements. The primary criteria for determining suitability are procedural clarity and completeness, and assessment of evaluation reliability. 'Micro-measurement' inspection of fundamental geometric configurations such as optical fiber geometry and connector ferrule end face topography are not within the scope of this procedure.