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Provides general details, quality assessment procedures, test and measurement procedures and a common blank detail specification.
Author | BSI |
---|---|
Editor | BSI |
Document type | Standard |
Format | File |
EAN ISBN | 0 580 15560 9 |
ICS | 31.200 : Integrated circuits. Microelectronics
|
Number of pages | 60 |
Replace | BS CECC 90100:1983 |
Cross references | EN 190100:1993,CECC 90100:1986 |
Modified by | AMD 5562 published December 1987 effective December 1987 Free of charge incorporated |
Set | MYSTD-20STD |
Year | 1980 |
Country | United Kingdom |
Keyword | BS CECC 90100:1986 |