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BS EN 60444-2:1997
New product
BS EN 60444-2:1997
Measurement of quartz crystal unit parameters - Phase offset method for measurement of motional capacitance of quartz crystal unitsMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 0 580 22497 X |
| ICS | 31.140 : Piezoelectric devices
|
| Number of pages | 16 |
| Cross references | IEC 60444-2:1980,EN 60444-2:1997 |
| Modified by | AMD 9658 published October 1997 effective October 1997 Free of charge incorporated |
| Set | MYSTD-20STD |
| Year | 1990 |
| Country | United Kingdom |
| Keyword | BS 7681:Part 2:1993 |