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BS EN 62047-21:2014

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BS EN 62047-21:2014

Semiconductor devices. Micro-electromechanical devices - Test method for Poisson's ratio of thin film MEMS materials

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Author BSI
Editor BSI
Document type Standard
Format File
EAN ISBN 978 0 580 77554 3
ICS 31.080.99 : Other semiconductor devices
Number of pages 18
Cross references EN 62047-21:2014,IEC 62047-21:2014
Set MYSTD-20STD
Year 2014
Country United Kingdom
Keyword BS EN 62047-21 ; BSEN62047-21 ; BS EN 6204721 ; BS EN 62047:21 ; BSEN 62047 21 ; BS EN62047 21