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BS EN 15991:2015
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BS EN 15991:2015
Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)More info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 978 0 580 83140 9 |
| ICS | 81.060.10 : Raw materials
|
| Number of pages | 30 |
| Replace | BS EN 15991:2011 |
| Cross references | EN 15991:2015 |
| Set | MYSTD-20STD |
| Year | 2015 |
| Country | United Kingdom |
| Keyword | BS EN 15991 ; BSEN15991 ; BSEN 15991 ; BS EN15991 |