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1.1 This test method describes an accurate technique for measuring the normal spectral emittance of electrically nonconducting materials in the temperature range from 1000 to 1800 K, and at wavelengths from 1 to 35 μm. It is particularly suitable for measuring the normal spectral emittance of materials such as ceramic oxides, which have relatively low thermal conductivity and are translucent to appreciable depths (several millimetres) below the surface, but which become essentially opaque at thicknesses of 10 mm or less.
Author | ASTM |
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Editor | ASTM |
Document type | Standard |
Format | File |
Confirmation date | 2014-04-01 |
ICS | 49.025.01 : Materials for aerospace construction in general
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Number of pages | 9 |
Replace | ASTM E423-71(2008) |
Set | ASTMVOL1503 |
Year | 1970 |
Document history | |
Country | USA |
Keyword | ASTM 423;ASTM E423;ASTM E423;10.1520/E0423-71R14 |